"Field-effect transistors+Testing." - ECU Libraries Catalog

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Cover image for Evaluation of an electronic load for pulsed current characterization of power semiconductors

Evaluation of an electronic load for pulsed current characterization of power semiconductors

by Griffin, Timothy E.
2010
Format: Electronic

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Cover image for Impact of accelerated stress-tests on SIC MOSFET precursor parameters

Impact of accelerated stress-tests on SIC MOSFET precursor parameters

by Kozak, Joseph P.
2018
Format: Electronic

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Cover image for RF and microwave modeling and measurement techniques for field effect transistors

RF and microwave modeling and measurement techniques for field effect transistors

by Gao, Jianjun, 1968-
2010
Format: Electronic

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Cover image for Low-temperature operation of a Buck DC/DC converter

Low-temperature operation of a Buck DC/DC converter

1995
Format: Book

Location	Call #	Status
Joyner - Microforms B300	NAS 1.15:107021	✔ Available