"Nanotechnology+Measurement." - ECU Libraries Catalog

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Cover image for Fundamental Principles of Engineering Nanometrology

Fundamental Principles of Engineering Nanometrology

by Leach, Richard Professor
2009
Format: Electronic

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Cover image for 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M NANO)

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M NANO)

by IEEE Staff
2018
Format: Electronic

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Cover image for The IEE Seminar on MNT in Medicine

The IEE Seminar on MNT in Medicine

by IEE Seminar on MNT in Medicine
2004
Format: Electronic

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Cover image for Nanotechnology safety and health

Nanotechnology safety and health

2011
Format: Book

Location	Call #	Status
Joyner - General Stacks	T174.7 .N375333 2011	✔ Available

Cover image for Semiconductor microelectronics and nanoelectronics programs

Semiconductor microelectronics and nanoelectronics programs

2006
Format: Electronic

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Cover image for Interdisciplinary approaches to safe nanotechnologies

Interdisciplinary approaches to safe nanotechnologies

by Symposium RR, "Interdisciplinary Approaches to Safe Nanotechnologies"
2011
Format: Book

Location	Call #	Status
Joyner - General Stacks	T174.7 .S967 2011	✔ Available

Cover image for Approaches to safe nanotechnology

Approaches to safe nanotechnology

2009
Format: Electronic

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Cover image for Nanotechnology & workplace safety and health

Nanotechnology & workplace safety and health

2004
Format: Electronic

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Cover image for Nanotechnology safety

Nanotechnology safety

2013
First edition
Format: Electronic

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Cover image for Occupational exposure to carbon nanotubes and nanofibers

Occupational exposure to carbon nanotubes and nanofibers

2013
Format: Electronic

Location
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