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Cover image for A technique for measuring the surface temperature of transistors by means of fluorescent phosphor

A technique for measuring the surface temperature of transistors by means of fluorescent phosphor

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:591 ✔ Available
Cover image for Field-effect and bipolar power transistor physics

Field-effect and bipolar power transistor physics

Location Call # Status
Joyner - General Stacks TK7871.95 .B56 ✔ Available
Cover image for Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor

Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor

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Cover image for Handbook of electronic components and ciruits

Handbook of electronic components and ciruits

Location Call # Status
Joyner - General Stacks TK7871.95 .L364X ✔ Available
Cover image for Development of gate and base drive using SiC junction field effect transistors

Development of gate and base drive using SiC junction field effect transistors

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Cover image for Electrons and holes in semiconductors

Electrons and holes in semiconductors

Location Call # Status
Joyner - General Stacks QC721 .S52 ✔ Available
Cover image for Practical transistor theory

Practical transistor theory

Location Call # Status
Joyner - General Stacks TK7871.9 .W5 1967 ✔ Available
Cover image for Transistor physics and circuits

Transistor physics and circuits

Location Call # Status
Joyner - General Stacks TK7871.9 .R57 1966 ✔ Available
Cover image for Abc's of unijunction transistors

Abc's of unijunction transistors

Location Call # Status
Joyner - General Stacks TK7871.92 .H34 ✔ Available
Cover image for The physical theory of transistors

The physical theory of transistors

Location Call # Status
Joyner - General Stacks QC612.S4 V34 ✔ Available