Start Over
You searched for: subject "X-Ray Diffraction"

Search Results

Cover image for Quantitative interpretation of mineralogical composition from X-ray and chemical data for the Pierre Shale

Quantitative interpretation of mineralogical composition from X-ray and chemical data for the Pierre Shale

Location Call # Status
Joyner - General Stacks QE75 .P9 NO. 388-391 ✔ Available
Cover image for Motorized beam alignment of a commercial x-ray diffractometer

Motorized beam alignment of a commercial x-ray diffractometer

Location
Access Content Online
Cover image for Boron nitride nanoribbons from exfoliation of boron nitride nanotubes

Boron nitride nanoribbons from exfoliation of boron nitride nanotubes

Location
Access Content Online
Cover image for Exfoliation of hexagonal boron nitride via ferric chloride intercalation

Exfoliation of hexagonal boron nitride via ferric chloride intercalation

Location
Access Content Online
Cover image for High-temperature oxidation behavior of reaction-formed silicon carbide ceramics

High-temperature oxidation behavior of reaction-formed silicon carbide ceramics

Location Call # Status
Joyner - Microforms B300 NAS 1.15:111682 ✔ Available
Cover image for Preliminary geological findings on the BP-1 simulant

Preliminary geological findings on the BP-1 simulant

Location
Access Content Online
Cover image for Chemical, structural, and microstructural changes in metallic and silicon-based coating materials exposed to iodine vapor

Chemical, structural, and microstructural changes in metallic and silicon-based coating materials exposed to iodine vapor

Location
Access Content Online
Cover image for Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists

Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists

Location
Access Content Online
Cover image for Characterization of 4H <000-1> silicon carbide films grown by solvent-laser heated floating zone

Characterization of 4H <000-1> silicon carbide films grown by solvent-laser heated floating zone

Location
Access Content Online
Cover image for X-ray diffraction imaging

X-ray diffraction imaging

Location
Access Content Online