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Cover image for Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes

Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes

by Schnabel, C. M.
2000
Format: Electronic

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Cover image for Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes

Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes

2000
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	NAS 1.15:209648	✔ Available