"Integrated circuits+Very large scale integration.+Defects." - ECU Libraries Catalog

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Cover image for Yield simulation for integrated circuits

Yield simulation for integrated circuits

by Walker, Duncan Moore Henry
1987
Format: Book

Location	Call #	Status
Joyner - General Stacks	TK7874 .W34 1987	✔ Available

Cover image for Integrated circuit defect-sensitivity

Integrated circuit defect-sensitivity

by Pineda de Gyvez, José
1993
Format: Book

Location	Call #	Status
Joyner - General Stacks	TK7874 .P53 1993	✔ Available