"Microelectronics+Measurement." - ECU Libraries Catalog

Preview Version: You're viewing our new catalog design. Share your feedback or return to the current catalog.

Start Over

You searched for: subject "Microelectronics+Measurement."

Showing 1 - 9 of 9 results

Search Results

Cover image for Semiconductor microelectronics and nanoelectronics programs

Semiconductor microelectronics and nanoelectronics programs

2006
Format: Electronic

Location
Access Content Online

Cover image for Digital holography for MEMS and microsystem metrology

Digital holography for MEMS and microsystem metrology

2011
Format: Electronic

Location
Access Content Online

Cover image for Measurement accuracy

Measurement accuracy

by ARFTG Conference
2003
Format: Electronic

Location
Access Content Online

Cover image for Measurement needs for emerging technologies

Measurement needs for emerging technologies

by ARFTG Conference
2002
Format: Electronic

Location
Access Content Online

Cover image for Radio frequency (RF) measurements for human detection, tracking, and identification

Radio frequency (RF) measurements for human detection, tracking, and identification

by Pizzillo, Thomas J.
2007
Format: Electronic

Location
Access Content Online

Cover image for 2007 69th ARFTG Conference

2007 69th ARFTG Conference

by IEEE Staff
2007
Format: Electronic

Location
Access Content Online

Cover image for Semiconductor microelectronics and nanoelectronics programs

Semiconductor microelectronics and nanoelectronics programs

2007
Format: Electronic

Location
Access Content Online

Cover image for Semiconductor microelectronics and nanoelectronics programs

Semiconductor microelectronics and nanoelectronics programs

2003
Format: Microform

Location
Access Content Online

Cover image for Programs, activities, and accomplishments

Programs, activities, and accomplishments

by National Institute of Standards and Technology (U.S.).
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	C 13.58	✔ Available