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Cover image for Introduction to optical testing

Introduction to optical testing

Location Call # Status
Joyner - General Stacks TS514 .G43 1993 ✔ Available
Cover image for Interferometric metrology of photomask blanks

Interferometric metrology of photomask blanks

  • 2000
  • Format: Microform
Location Call # Status
Joyner - Microforms B300 C 13.58:6701 ✔ Available
Cover image for Automated photomask inspection

Automated photomask inspection

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-46 ✔ Available
Cover image for Rationale and procedures for development of a NASA primary metrology laboratory for large optics

Rationale and procedures for development of a NASA primary metrology laboratory for large optics

Location Call # Status
Joyner - Microforms B300 C 13.58:6710 ✔ Available
Cover image for Calibration laboratories

Calibration laboratories

  • 2001
  • Format: Electronic
Location
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Cover image for National Voluntary Laboratory Accreditation Program

National Voluntary Laboratory Accreditation Program

Location Call # Status
Joyner - Fed Docs Stacks C 13.11:150-2 E ✔ Available