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Cover image for Electron optical applications in materials science

Electron optical applications in materials science

Joyner Library - General Stacks
Call Number: TA418.5 .M87
Cover image for Facility for interferometric testing of 1.25-m mirrors at liquid helium temperatures

Facility for interferometric testing of 1.25-m mirrors at liquid helium temperatures

Joyner Library - Microforms B300
Call Number: NAS 1.15:101017
Cover image for Mechanical protection of DLC films on fused silica slides

Mechanical protection of DLC films on fused silica slides

Joyner Library - Microforms B300
Call Number: NAS 1.15:87056
Cover image for Simple test procedure for image-based biometric verification systems

Simple test procedure for image-based biometric verification systems

Joyner Library - Microforms B300
Call Number: C 13.58:6336
Cover image for Interferometric metrology of photomask blanks

Interferometric metrology of photomask blanks

Joyner Library - Microforms B300
Call Number: C 13.58:6701
Cover image for Introduction to optical testing

Introduction to optical testing

Joyner Library - General Stacks
Call Number: TS514 .G43 1993
Cover image for Automated photomask inspection

Automated photomask inspection

Joyner Library - Fed Docs Stacks
Call Number: C 13.10:400-46