Search Results
Showing 1 - 10 of 15 results
Search Results
Ion implantation, sputtering and their applications
Joyner Library
- General Stacks
Call Number:
QC702.7.I55 T67
Thin film and depth profile analysis
Joyner Library
- General Stacks
Call Number:
QC176.84.S93 T46 1984
Application of ion beam milling to the characterization of cracks in metals
Joyner Library
- Fed Docs Stacks
Call Number:
C13.46:862
Ion surface interaction, sputtering and related phenomena
Joyner Library
- General Stacks
Call Number:
QC702.7.S3 I57 1972
Characteristic morphological and frictional changes in sputtered MoS₂ films
Joyner Library
- Microforms B300
Call Number:
NAS 1.15:83565