IEEE Computer Society, Test Technology Technical Committee Staff. - ECU Libraries Catalog

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Cover image for IEEE International High-Level Design Validation and Test Workshop

IEEE International High-Level Design Validation and Test Workshop

by IEEE Computer Society, Technical Council on Test Technology Staff
2000
Format: Electronic

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Cover image for Rapid Systems Prototyping

Rapid Systems Prototyping

by IEEE Computer Society, Technical Committee on Simulation
1999
Format: Electronic

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Cover image for Records of the IEEE International Workshop on Memory Technology, Design, and Testing

Records of the IEEE International Workshop on Memory Technology, Design, and Testing

by IEEE International Workshop on Memory Technology, Design, and Testing
1994
Format: Electronic

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Cover image for 1999 IEEE International Conference on Microelectronic Systems Education (MSE'99)

1999 IEEE International Conference on Microelectronic Systems Education (MSE'99)

by IEEE International Conference on Microelectronic Systems Education
1999
Format: Electronic

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Cover image for 2003 IEEE International Conference on Microelectronic Systems Education

2003 IEEE International Conference on Microelectronic Systems Education

by IEEE International Conference on Microelectronic Systems Education
2003
Format: Electronic

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Cover image for 2005 IEEE International Conference on Microelectronic Systems Education (MSE '05)

2005 IEEE International Conference on Microelectronic Systems Education (MSE '05)

by IEEE International Conference on Microelectronic Systems Education
2005
Format: Electronic

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Cover image for Designing, testing, and diagnostics--join them

Designing, testing, and diagnostics--join them

by International Test Conference
1993
Format: Electronic

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Cover image for The changing philosophy of test

The changing philosophy of test

by International Test Conference
1990
Format: Electronic

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Cover image for Meeting the tests of time

Meeting the tests of time

by International Test Conference
1989
Format: Electronic

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Cover image for Discover the new world of test and design

Discover the new world of test and design

by International Test Conference
1992
Format: Electronic

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