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Showing 1 - 10 of 11 results
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Integrated circuit mask technology
Joyner Library
- General Stacks
Call Number:
HD9993.T693 U63 1997
Accurate linewidth measurement on integrated-circuit photomasks
Joyner Library
- Fed Docs Stacks
Call Number:
C 13.10:400-43
A production-compatible microelectronic test pattern for evaluating photomask misalignment
Joyner Library
- Fed Docs Stacks
Call Number:
C 13.10:400-51
Optical and dimensional-measurement problems with photomasking in microelectronics
Joyner Library
- Fed Docs Stacks
Call Number:
C13.10:400-20
Measurement assurance for dimensional measurements on integrated-circuit photomasks
Joyner Library
- Microforms B300
Call Number:
C 13.46:1164
Federal statutory protection for mask works
Joyner Library
- Fed Docs Stacks
Call Number:
ASK AT REFERENCE DESK
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Joyner Library
- Microforms B300
Call Number:
C 13.10:260-129