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Cover image for Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

Joyner Library - Microforms B300
Call Number: C 13.10:400-98
Cover image for Characterization of semiconductor heterostructures and nanostructures

Characterization of semiconductor heterostructures and nanostructures

  • 2013
  • Second edition
  • Format: Electronic
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Cover image for 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

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Cover image for 2001 6th International Workshop on Statistical Methodology

2001 6th International Workshop on Statistical Methodology

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Cover image for 1999 4th International Workshop on Statistical Metrology

1999 4th International Workshop on Statistical Metrology

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Cover image for IWSM

IWSM

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Cover image for Solar cells of metal-free phthalocyanine dispersed in polyvinyl carbazole

Solar cells of metal-free phthalocyanine dispersed in polyvinyl carbazole

Joyner Library - Microforms B300
Call Number: NAS 1.15:77043
Cover image for Device performance

Device performance

  • 2006
  • Format: Electronic
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Cover image for Characterization of semiconductor heterostructures and nanostructures

Characterization of semiconductor heterostructures and nanostructures

  • 2008
  • 1st ed.
  • Format: Electronic
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Cover image for Physics and technology of crystalline oxide semiconductor CAAC-IGZO

Physics and technology of crystalline oxide semiconductor CAAC-IGZO

  • 2017
  • Format: Electronic
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