"Semiconductors+Characterization." - ECU Libraries Catalog

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Cover image for Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

by Bullis, W. Murray, 1930-
1995
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	C 13.10:400-98	✔ Available

Cover image for Characterization of semiconductor heterostructures and nanostructures

Characterization of semiconductor heterostructures and nanostructures

2013
Second edition
Format: Electronic

Location
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Cover image for 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

by International Workshop on Statistical Metrology
1997
Format: Electronic

Location
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Cover image for 2001 6th International Workshop on Statistical Methodology

2001 6th International Workshop on Statistical Methodology

by International Workshop on Statistical Methodology
2001
Format: Electronic

Location
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Cover image for 1999 4th International Workshop on Statistical Metrology

1999 4th International Workshop on Statistical Metrology

by International Workshop on Statistical Metrology
1999
Format: Electronic

Location
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Cover image for IWSM

IWSM

by International Workshop on Statistical Metrology
1998
Format: Electronic

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Cover image for Solar cells of metal-free phthalocyanine dispersed in polyvinyl carbazole

Solar cells of metal-free phthalocyanine dispersed in polyvinyl carbazole

by Shimura, Michiko
1983
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	NAS 1.15:77043	✔ Available

Cover image for Device performance

Device performance

2006
Format: Electronic

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Cover image for Characterization of semiconductor heterostructures and nanostructures

Characterization of semiconductor heterostructures and nanostructures

2008
1st ed.
Format: Electronic

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Cover image for Physics and technology of crystalline oxide semiconductor CAAC-IGZO

Physics and technology of crystalline oxide semiconductor CAAC-IGZO

2017
Format: Electronic

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